// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of the License "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

// \f32test\loader\t_import_ldd.cpp

// 

//

#define __E32TEST_EXTENSION__

#include <e32test.h>

#include "d_export.h"

#include "d_import.h"

static RTest test(_L("t_import_ldd"));

TInt E32Main()

	{

	test.Title();

	test.Start(_L("Testing ldd importing"));

	test.Next(_L("Load the exporting ldd"));

	TInt r=User::LoadLogicalDevice(KExportTestLddName);

	test_Equal(KErrNone, r);	// Don't allow KErrAlreadyExists as don't want ldd to be XIP.

	RExportLdd exportLdd;

	test_KErrNone(exportLdd.Open());

	// The exported function multiplies the 2 arguments.

	test_Equal(12, exportLdd.RunExport(3, 4));

	test.Next(_L("Load the importing ldd"));

	r=User::LoadLogicalDevice(KImportTestLddName);

	test_Equal(KErrNone, r);	// Don't allow KErrAlreadyExists as don't want ldd to be XIP.

	RImportLdd importLdd;

	test_KErrNone(importLdd.Open());

	// The imported function multiplies the 2 arguments.

	test_Equal(12, importLdd.RunImport(3, 4));

	exportLdd.Close();

	importLdd.Close();

	test_KErrNone(User::FreeLogicalDevice(KExportTestLddName));

	test_KErrNone(User::FreeLogicalDevice(KImportTestLddName));

	test.End();

	return KErrNone;

    }