diff -r 000000000000 -r eb1f2e154e89 fep/frontendprocessor/test/inc/TFepGen.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/fep/frontendprocessor/test/inc/TFepGen.h	Tue Feb 02 01:02:04 2010 +0200
@@ -0,0 +1,65 @@
+// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @test
+ @internalComponent - Internal Symbian test code
+*/
+
+#if !defined(__TFEPGEN_H__)
+#define __TFEPGEN_H__
+
+#include <coecntrl.h>
+#include <test/testexecutestepbase.h>
+#include "appfwk_test_AppUi.h"
+
+
+//! A CTestStep Derived Class.
+class CTFepGenStep : public CTmsTestStep
+	{
+public:
+	CTFepGenStep();
+	~CTFepGenStep();
+	virtual TVerdict doTestStepL();
+	void ConstructFepGenAppL(CCoeEnv* aCoe);
+private:
+	};
+	
+
+//! A CTestCoeAppUi derived class.
+class CFepGenAppUi : public CTestCoeAppUi 
+    {
+public:
+	CFepGenAppUi(CTmsTestStep* aStep);
+    ~CFepGenAppUi();
+    void ConstructL();
+	void DoTestsL();
+protected:
+	void RunTestStepL(TInt aStepNum);
+private:
+	void CreateFepGenericL();
+	void FepStoreAndBroadCastL();
+	void StoreOriginalSettingsL();
+	void RetrieveOriginalSettingsL();
+   	};
+ 
+ 
+_LIT(KTFepGen,"TFepGen");
+
+#endif
+
+
+