diff -r 3365349494cc -r cdf2f6e5c390 egl/egltest/inc/egltest_stress_process_sgimage.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/egl/egltest/inc/egltest_stress_process_sgimage.h	Thu May 27 14:13:51 2010 +0300
@@ -0,0 +1,54 @@
+// Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @test
+*/
+
+#ifndef __EGLTEST_STRESS_PROCESS_SGIMAGE_H__
+#define __EGLTEST_STRESS_PROCESS_SGIMAGE_H__
+
+#include "egltest_stress_common_sgimage.h"
+
+/**
+Standard prototypes
+*/
+GLDEF_C TInt E32Main(void);
+LOCAL_C void LaunchClientProcessL();
+
+//Panic string
+_LIT(KStressTestChildAppPanic, "Stress Test Child App");
+
+class CTReadWriteChild : public CTReadWrite
+    {
+public:
+    static CTReadWriteChild* NewL(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);
+
+private:
+    CTReadWriteChild(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);
+    void ReadImageFuncL();
+    void ReadFuncL();
+    void WriteImageFuncL();
+    void VgImageFuncL();
+    void MakeCurrentL() const;
+    TBool IsFinished();
+    void PixmapSurfaceFuncL();
+
+private:
+    VGImage iImage;
+    };
+
+#endif //__EGLTEST_STRESS_PROCESS_SGIMAGE_H__